Seagate Computer Drive 1200 SSD User Guide

Product Manual  
®
Seagate 1200 SSD  
High Endurance  
Limited Warranty with  
Media Usage  
Limited Warranty with  
Media Usage  
2.5” models  
Managed Life  
2.5” models  
Limited Warranty with  
Media Usage  
1.8” models  
2.5” models  
Standard drives  
ST800FM0013  
ST400FM0013  
ST200FM0013  
Standard drives  
ST400FM0093  
ST200FM0093  
ST100FM0093  
Standard drives  
ST800FM0043  
ST400FM0053  
ST200FM0053  
Standard drives  
ST400FM0063  
ST200FM0063  
Self-Encrypting drives  
ST800FM0023  
ST400FM0033  
Self-Encrypting drives  
ST400FM0103  
Self-Encrypting drives  
ST800FM0053  
Self-Encrypting drives  
ST400FM0083  
ST200FM0103  
ST400FM0073  
ST200FM0033  
ST200FM0083  
ST100FM0103  
ST200FM0073  
SED FIPS 140-2 Models  
(Review Pending)  
ST800FM0033  
High Endurance  
Managed Life 2.5” models  
SED FIPS 140-2 Models  
(Review Pending)  
ST800FM0063  
Managed Life  
1.8” models  
Standard drives  
ST400FM0113  
ST200FM0113  
ST100FM0113  
Standard drives  
ST400FM0023  
ST200FM0023  
High Endurance SED drives  
ST400FM0123  
Self-Encrypting drives  
ST400FM0043  
ST200FM0123  
ST200FM0043  
ST100FM0123  
100708406  
Rev. A  
July 2013  
 
CONTENTS  
5.3.2  
SEAGATE 1200 SSD PRODUCT MANUAL, REV. A  
I
 
CONTENTS  
9.5.3  
SEAGATE 1200 SSD PRODUCT MANUAL, REV. A  
II  
 
CONTENTS  
11.7  
SEAGATE 1200 SSD PRODUCT MANUAL, REV. A  
III  
 
FIGURES  
SEAGATE 1200 SSD PRODUCT MANUAL, REV. A  
IV  
 
Seagate Technology Support Services  
For information regarding online support and services, visit http://www.seagate.com/about/contact-us/technical-support/  
Available services include:  
Presales & Technical support  
Global Support Services telephone numbers & business hours  
Authorized Service Centers  
Warranty terms will vary based on type of warranty chosen: “Managed Life” or “Limited Warranty with Media  
Usage”.  
Consult the Seagate sales representative for warranty terms and conditions.  
For information regarding data recovery services, visit http://www.seagate.com/services-software/data-recovery-services/  
Seagate 1200 SSD Product Manual, Rev. A  
1
 
   
1.0 SCOPE  
®
This manual describes Seagate Technology LLC, Seagate® 1200 SSD (Serial Attached SCSI) drives.  
Seagate 1200 SSD drives support the SAS Protocol specifications to the extent described in this manual. The SAS Interface  
Manual (part number 100293071) describes the general SAS characteristics of this and other Seagate SAS drives. The Self-  
Encrypting Drive Reference Manual, part number 100515636, describes the interface, general operation, and security  
features available on Self-Encrypting Drive models.  
Product data communicated in this manual is specific only to the model numbers listed in this manual. The data listed in this  
manual may not be predictive of future generation specifications or requirements. If designing a system which will use one of  
the models listed or future generation products and need further assistance, please contact the Field Applications Engineer  
Unless otherwise stated, the information in this manual applies to standard and Self-Encrypting Drive models.  
2.5” Models - Limited Warranty with Media Usage  
2.5” Models - Managed Life  
Standard  
Self-Encrypting  
ST800FM0053  
ST400FM0073  
ST200FM0073  
SED FIPS 140-2  
Standard  
Self-Encrypting  
ST800FM0023  
ST400FM0033  
ST200FM0033  
SED FIPS 140-2  
ST800FM0033  
ST800FM0043  
ST400FM0053  
ST200FM0053  
ST800FM0063  
ST800FM0013  
ST400FM0013  
ST200FM0013  
1.8” Models -  
Limited Warranty with Media Usage  
1.8” Models -  
Managed Life  
Standard  
Self-Encrypting  
ST400FM0083  
ST200FM0083  
Standard  
Self-Encrypting  
ST400FM0043  
ST200FM0043  
ST400FM0063  
ST200FM0063  
ST400FM0023  
ST200FM0023  
High Endurance 2.5” Models -  
Limited Warranty with Media Usage  
High Endurance 2.5” Models -  
Managed Life  
Standard  
Self-Encrypting  
ST400FM0103  
ST200FM0103  
ST100FM0103  
Standard  
Self-Encrypting  
ST400FM0123  
ST200FM0123  
ST100FM0123  
ST400FM0093  
ST200FM0093  
ST100FM0093  
ST400FM0113  
ST200FM0113  
ST100FM0113  
Note. Previous generations of Seagate Self-Encrypting Drive models were called Full Disk Encryption (FDE) models  
before a differentiation between drive-based encryption and other forms of encryption was necessary.  
SEAGATE 1200 SSD PRODUCT MANUAL, REV. A  
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2.0 APPLICABLE STANDARDS AND REFERENCE DOCUMENTATION  
The drives documented in this manual have been developed as system peripherals to the highest standards of design and  
construction. The drives depend on host equipment to provide adequate power and environment for optimum performance  
and compliance with applicable industry and governmental regulations. Special attention must be given in the areas of  
safety, power distribution, shielding, audible noise control, and temperature regulation. In particular, the drives must be  
securely mounted to guarantee the specified performance characteristics. Mounting by bottom holes must meet the  
2.1  
STANDARDS  
The Seagate 1200 SSD family complies with Seagate standards as noted in the appropriate sections of this manual and the  
Seagate SAS Interface Manual, part number 100293071.  
The drives are recognized in accordance with UL 60950-1 as tested by UL, CSA 60950-1 as tested by CSA, and EN60950-1  
as tested by TUV.  
The security features of Self-Encrypting Drive models are based on the “TCG Storage Architecture Core Specification” and  
the “TCG Storage Workgroup Security Subsystem Class: Enterprise_A” specification with additional vendor-unique features  
as noted in this product manual.  
2.1.1 Electromagnetic compatibility  
The drive, as delivered, is designed for system integration and installation into a suitable enclosure prior to use. The drive is  
supplied as a subassembly and is not subject to Subpart B of Part 15 of the FCC Rules and Regulations nor the Radio  
Interference Regulations of the Canadian Department of Communications.  
The design characteristics of the drive serve to minimize radiation when installed in an enclosure that provides reasonable  
shielding. The drive is capable of meeting the Class B limits of the FCC Rules and Regulations of the Canadian Department  
of Communications when properly packaged; however, it is the user’s responsibility to assure that the drive meets the  
appropriate EMI requirements in their system. Shielded I/O cables may be required if the enclosure does not provide  
adequate shielding. If the I/O cables are external to the enclosure, shielded cables should be used, with the shields  
grounded to the enclosure and to the host controller.  
2.1.1.1 Electromagnetic susceptibility  
As a component assembly, the drive is not required to meet any susceptibility performance requirements. It is the  
responsibility of those integrating the drive within their systems to perform those tests required and design their system to  
ensure that equipment operating in the same system as the drive or external to the system does not adversely affect the  
2.1.2 Electromagnetic compliance  
Seagate uses an independent laboratory to confirm compliance with the directives/standards for CE Marking and C-Tick  
Marking. The drive was tested in a representative system for typical applications and comply with the Electromagnetic  
Interference/Electromagnetic Susceptibility (EMI/EMS) for Class B products. The selected system represents the most  
popular characteristics for test platforms. The system configurations include:  
• Typical current use microprocessor  
• Keyboard  
• Monitor/display  
• Printer  
• Mouse  
Although the test system with this Seagate model complies with the directives/standards, we cannot guarantee that all  
systems will comply. The computer manufacturer or system integrator shall confirm EMC compliance and provide the  
appropriate marking for their product.  
Electromagnetic compliance for the European Union  
If this model has the CE Marking it complies with the European Union requirements of the Electromagnetic Compatibility  
Directive 2004/108/EC as put into place on 20 July 2007.  
SEAGATE 1200 SSD PRODUCT MANUAL, REV. A  
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Australian C-Tick  
If this model has the C-Tick Marking it complies with the Australia/New Zealand Standard AS/NZ CISPR22 and meets the  
Electromagnetic Compatibility (EMC) Framework requirements of Australia’s Spectrum Management Agency (SMA).  
Korean KCC  
If these drives have the Korean Communications Commission (KCC) logo, they comply with KN22, KN 24, and KN61000.  
Taiwanese BSMI  
If this model has the Taiwanese certification mark then it complies with Chinese National Standard, CNS13438.  
2.1.3 European Union Restriction of Hazardous Substances (RoHS)  
The European Union Restriction of Hazardous Substances (RoHS) Directive restricts the presence of chemical substances,  
including Lead (Pb), in electronic products effective July 2006.  
A number of parts and materials in Seagate products are procured from external suppliers. We rely on the representations of  
our suppliers regarding the presence of RoHS substances in these parts and materials. Our supplier contracts require  
compliance with our chemical substance restrictions, and our suppliers document their compliance with our requirements by  
providing material content declarations for all parts and materials for the disk drives documented in this publication. Current  
supplier declarations include disclosure of the inclusion of any RoHS-regulated substance in such parts or materials.  
Seagate also has internal systems in place to ensure ongoing compliance with the RoHS Directive and all laws and  
regulations which restrict chemical content in electronic products. These systems include standard operating procedures that  
ensure that restricted substances are not utilized in our manufacturing operations, laboratory analytical validation testing,  
and an internal auditing process to ensure that all standard operating procedures are complied with.  
2.1.4 China Restriction of Hazardous Substances (RoHS) Directive  
This product has an Environmental Protection Use Period (EPUP) of 20 years. The following table contains  
information mandated by China's "Marking Requirements for Control of Pollution Caused by Electronic  
Information Products" Standard.  
"O" indicates the hazardous and toxic substance content of the part (at the homogenous material level) is lower than the  
threshold defined by the China RoHS MCV Standard.  
"X" indicates the hazardous and toxic substance content of the part (at the homogenous material level) is over the threshold  
defined by the China RoHS MCV Standard.  
SEAGATE 1200 SSD PRODUCT MANUAL, REV. A  
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2.2  
REFERENCE DOCUMENTS  
SCSI Commands Reference Manual  
SAS Interface Manual  
Seagate part number: 100293068  
Seagate part number: 100293071  
ANSI SAS Documents  
SFF-8144  
54mm x 78.5mm Form Factor with micro serial connector  
2.5” Drive Form Factor with Serial Connector  
HSS Backplane Design Guidelines  
Multi Lane Copper Connector  
SFF-8223  
SFF-8460  
SFF-8470  
SFF-8482  
SAS Plug Connector  
ANSI INCITS.xxx Serial Attached SCSI (SAS-3) Standard (T10/2212-D)  
ISO/IEC 14776-xxx SCSI Architecture Model-5 (SAM-5) Standard (T10/2104-D)  
ISO/IEC 14776-xxx SCSI Primary Commands-4 (SPC-4) Standard (T10/1731-D)  
ISO/IEC 14776-xxx SCSI Block Commands-3 (SBC-3) Standard (T10/1799-D)  
ANSI Small Computer System Interface (SCSI) Documents  
X3.270-1996 (SCSI-3) Architecture Model  
Trusted Computing Group (TCG) Documents (apply to Self-Encrypting Drive models only)  
TCG Storage Architecture Core Specification, Rev. 1.0  
TCG Storage Security Subsystem Class Enterprise Specification, Rev. 1.0  
Self-Encrypting Drives Reference Manual  
Seagate part number: 100515636  
In case of conflict between this document and any referenced document, this document takes precedence.  
SEAGATE 1200 SSD PRODUCT MANUAL, REV. A  
5
 
         
3.0 GENERAL DESCRIPTION  
Seagate 1200 SSD drives provide high performance, high capacity data storage for a variety of systems with a Serial  
Attached SCSI (SAS) interface. The Serial Attached SCSI interface is designed to meet next-generation computing demands  
for performance, scalability, flexibility and high-density storage requirements.  
Seagate 1200 SSD drives are random access storage devices designed to support the Serial Attached SCSI Protocol as  
described in the ANSI specifications, this document, and the SAS Interface Manual (part number 100293071) which  
describes the general interface characteristics of this drive. Seagate 1200 SSD drives are classified as intelligent peripherals  
and provide level 2 conformance (highest level) with the ANSI SCSI-1 standard. The SAS connectors, cables and electrical  
interface are compatible with Serial ATA (SATA), giving future users the choice of populating their systems with either SAS or  
SATA drives. This allows users to continue to leverage existing investment in SCSI while gaining a 12Gb/s serial data  
transfer rate.  
The Self-Encrypting Drive models indicated on the cover of this product manual have provisions for “Security of Data at Rest”  
based on the standards defined by the Trusted Computing Group (see www.trustedcomputinggroup.org).  
Note. Never disassemble and do not attempt to service items in the enclosure. The drive does not contain user-  
replaceable parts. Opening for any reason voids the drive warranty..  
3.1  
STANDARD FEATURES  
Seagate 1200 SSD drives have the following standard features:  
• 1.5 / 3.0 / 6.0 / 12.0* Gb Serial Attached SCSI (SAS) interface (* 12.0 Gb only available on 2.5” models)  
• Integrated dual port SAS controller supporting the SCSI protocol  
• Support for SAS expanders and fanout adapters  
• Firmware downloadable using the SAS interface  
• 128 - deep task set (queue)  
• Supports up to 32 initiators  
• Jumperless configuration  
• User-selectable logical block size (512, 520, 524, 528, 4096, 4160, 4192, or 4224 bytes per logical block)  
• Industry standard SFF 1.8 and 2.5-inch dimensions  
• ECC, LDPC, and Micro-RAID Error Recovery  
• No preventive maintenance or adjustments required  
• Self diagnostics performed when power is applied to the drive  
• Vertical, horizontal, or top down mounting  
• Drive Self Test (DST)  
• Parallel flash access channels  
• Power loss data protection  
• Thin Provisioning with Block Unmap Support  
• Silent operation  
• Lifetime Endurance Management (available by default on Managed Life models)  
Seagate 1200 SSD Self-Encrypting Drive models have the following additional features:  
• Automatic data encryption/decryption  
• Controlled access  
• Random number generator  
• Drive locking  
• Up to 16 independent data bands  
• Cryptographic erase of user data for a drive that will be repurposed or scrapped  
• Authenticated firmware download  
• SANITIZE command support  
SEAGATE 1200 SSD PRODUCT MANUAL, REV. A  
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3.2  
MEDIA DESCRIPTION  
The media used on the drive consists of Multi Layer Cell (MLC) NAND Flash for improved reliability and performance.  
3.3  
PERFORMANCE  
• Firmware controlled multi-segmentable cache buffer  
• Up to 1200MB/s maximum instantaneous data transfers on 12Gb capable configurations.  
• Background processing of queue  
• Non-Volatile Write Cache  
Note. There is no significant performance difference between Self-Encrypting Drive and standard (non-Self-Encrypting  
Drive) models.  
3.4  
RELIABILITY  
• Annualized Failure Rate (AFR) of 0.44%  
• Mean time between failures (MTBF) of 2,000,000 hours  
• Incorporates industry-standard Self-Monitoring Analysis and Reporting Technology (S.M.A.R.T.)  
• "Managed Life" or "Limited Warranty with Media Usage" warranty options [1]  
[1] Warranty terms will vary based on type of warranty chosen: “Managed Life” or “Limited Warranty with Media Usage”.  
Consult the Seagate sales representative for warranty terms and conditions.  
3.5  
FORMATTED CAPACITIES  
Standard OEM models are formatted to 512 bytes per block. The block size is selectable at format time. Supported block  
sizes are 512, 520, 524, 528, 4096, 4160, 4192, and 4224. Users having the necessary equipment may modify the data  
block size before issuing a format command and obtain different formatted capacities than those listed.  
To provide a stable target capacity environment and at the same time provide users with flexibility if they choose, Seagate  
recommends product planning in one of two modes:  
Seagate designs specify capacity points at certain block sizes that Seagate guarantees current and future products will  
meet. We recommend customers use this capacity in their project planning, as it ensures a stable operating point with  
backward and forward compatibility from generation to generation. The current guaranteed operating points for this product  
are shown below. The Capacity stated is identical when the drive is formatted with or without PI enabled.  
Table 1 Formatted Capacity Block Count  
CAPACITY (BLOCKS)  
800GB  
400GB  
200GB  
100GB  
BLOCK  
SIZE  
DECIMAL  
HEX  
DECIMAL  
HEX  
DECIMAL  
HEX  
DECIMAL  
HEX  
1,562,824,368  
1,529,743,600  
1,509,354,136  
1,487,666,080  
195,353,046  
192,307,693  
190,839,695  
189,393,940  
5D26CEB0h  
781,422,768  
764,871,800  
754,677,072  
743,833,040  
97,677,846  
96,153,847  
95,419,848  
94,696,970  
2E9390B0h  
390,721,968  
382,435,904  
377,338,536  
371,916,520  
48,840,246  
48,076,924  
47,709,924  
47,348,485  
1749F1B0h  
195,371,568  
191,217,952  
188,669,272  
185,958,264  
24,421,446  
24,038,462  
23,854,962  
23,674,243  
BA52230h  
512  
5B2E08F0h  
59F6EA98h  
58ABFBA0h  
BA4D9D6h  
B7661EDh  
B5FFB8Fh  
B49EC14h  
2D970478h  
2CFB7550h  
2C55FDD0h  
5D27216h  
5BB30F7h  
5AFFDC8h  
5A4F60Ah  
16CB8240h  
167DBAA8h  
162AFEE8h  
2E93E36h  
2DD987Ch  
2D7FEE4h  
2D27B05h  
B65C120h  
B3EDD58h  
B157F78h  
174A446h  
16ECC3Eh  
16BFF72h  
1693D83h  
520  
524  
528  
4096  
4160  
4192  
4224  
SEAGATE 1200 SSD PRODUCT MANUAL, REV. A  
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3.6  
PROGRAMMABLE DRIVE CAPACITY  
Using the MODE SELECT command, the drive can change its capacity to something less than maximum. See the MODE  
SELECT (6) parameter list table in the SAS Interface Manual, part number 100293071. A value of zero in the Number of  
Blocks field indicates that the drive will not change the capacity it is currently formatted to have. A number other than zero  
and less than the maximum number of LBAs in the Number of Blocks field changes the total drive capacity to the value in the  
Number of Blocks field. A value greater than the maximum number of LBAs is rounded down to the maximum capacity.  
3.7  
FACTORY-INSTALLED OPTIONS  
OEMs may order the following items which are incorporated at the manufacturing facility during production or packaged  
before shipping. Some of the options available are (not an exhaustive list of possible options):  
• Other capacities can be ordered depending on LBA size requested and other factors.  
• Single-unit shipping pack. The drive is normally shipped in bulk packaging to provide maximum protection against transit  
damage. Units shipped individually require additional protection as provided by the single unit shipping pack. Users plan-  
ning single unit distribution should specify this option.  
• The Safety and Regulatory Agency Specifications, part number 75789512, is usually included with each standard OEM  
drive shipped, but extra copies may be ordered.  
3.8  
THIN PROVISIONING  
3.8.1 Logical Block Provisioning  
The drive is designed with a feature called Thin Provisioning. Thin Provisioning is a technique which does not require  
Logical Blocks to be associated to Physical Blocks on the storage medium until such a time as needed. The use of Thin  
Provisioning is a major factor in SSD products because it reduces the amount of wear leveling and garbage collection that  
must be performed. The result is an increase in the products endurance. For more details on Logical Block Provisioning and  
Thin Provisioning, Reference the SBC-3 document provided by the T-10 committee.  
3.8.2 Thin Provisioning capabilities  
The level of Thin Provisioning support may vary by product model. Devices that support Thin Provisioning are allowed to  
return a default data pattern for read requests made to Logical Blocks that have not been mapped to Physical Blocks by a  
previous WRITE command.  
In order to determine if Thin Provisioning is supported and what features of it are implemented requires the system to send a  
READ CAPACITY 16 (9Eh) command to the drive. Thin Provisioning and the READ CAPACITY 16 (9Eh) command is  
defined in the Seagate SCSI Command Reference 100293068.  
Product Configuration  
Non-SED  
LBPME  
LBPRZ  
Supported  
Supported  
Supported  
Not Supported  
SED  
A logical block provisioning management enabled (LBPME) bit set to one indicates that the logical unit implements logical  
block provisioning management. An LBPME bit set to zero indicates that the logical unit is fully provisioned and does not  
implement logical block provisioning management.  
A logical block provisioning read zeros (LBPRZ) bit set to one indicates that, for an unmapped LBA specified by a read  
operation, the device server sends user data with all bits set to zero to the data-in buffer. An LBPRZ bit set to zero indicates  
that, for an unmapped LBA specified by a read operation, the device server may send user data with all bits set to any value  
to the data-in buffer.  
3.8.3 UNMAP  
The UNMAP command requests that the device server break the association of a specific Logical Block address from a  
Physical Block, thereby freeing up the Physical Block from use and no longer requiring it to contain user data. An unmapped  
block will respond to a READ command with data that is determined by the setting of the LBPRZ bit in the READ CAPACITY  
parameter data.  
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3.8.4 FORMAT UNIT command  
A device which supports Thin Provisioning will be capable of performing a SCSI FORMAT UNIT command which allocates  
Logical Blocks Addresses that are not linked to Physical Block Locations. A FORMAT command will cause all LBAs to  
become unmapped.  
3.8.5 Protection Information (PI) and Security (SED)  
The requirements in this section apply to any device which supports LBA unmapping.  
In SCSI devices, umapped LBAs are defined as part of the Thin Provisioning model. Support of the Thin Provisioning model  
is indicated by the LBPME bit having a value of '1' in the READ CAPACITY (16) parameter data.  
When a region of LBA's are erased via cryptographic erase, as part of the erase, the drive shall unmap those LBAs.  
If the host attempts to access an unmapped or trimmed LBA, the drive shall return scrambled data. For a given LBA, the data  
shall be identical from access to access, until that LBA is either updated with actual data from the host or that LBA is  
cryptographically erased. The drive shall report a value of '0' in the LBPRZ field returned in the READ CAPACITY (16)  
parameter data.  
If the host attempts to access an unmapped LBA on a drive that has been formatted with Protection Information (PI), the  
drive shall return scrambled PI data for that LBA. Depending on the value of the RDPROTECT field in the data-access  
command CDB, this may result in the drive returning a standard PI error to the host.  
If the host reduces the addressable capacity of the drive via a MODE SELECT command, the drive shall unmap or trim any  
LBA within the inaccessible region of the device.  
Additionally, an UNMAP command is not permitted on a locked band.  
DRIVE CONFIGURATION  
Standard  
SED  
PI Setting  
Disabled  
Enabled  
Disabled  
Enabled  
PROT_EN bit  
LBPME bit  
0
1
0
1
1
1
1
1
LBPRZ bit  
1
1
0
0
PI Check Requested  
N/A  
Yes  
No  
N/A  
Yes  
No  
DATA Returned for  
0x00  
0x00  
0xFF  
0x00  
Random  
None  
None  
None  
Random  
Thin Provisioned LBA  
PI Returned for  
Thin Provisioned LBA  
Scrambled  
PI data  
None  
0xFF  
PI Check Performed  
Error reported to Host  
N/A  
No  
No  
No  
No  
No  
N/A  
No  
Yes  
Yes  
No  
No  
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4.0 PERFORMANCE CHARACTERISTICS  
This section provides detailed information concerning performance-related characteristics and features of Seagate 1200  
SSD drives.  
4.1  
INTERNAL DRIVE CHARACTERISTICS  
Flash Memory Type  
Emulated LBA Size  
Native Programmable  
Page Size  
NAND MLC  
512, 520, 524, 528, 4096, 4160, 4192 or 4224  
8192 User Bytes  
4096  
Map Unit Size  
Default Transfer  
Alignment Offset  
0
4.2  
PERFORMANCE CHARACTERISTICS  
4.2.1 Response time  
Response time measurements are taken with nominal power at 25°C ambient temperature. The typical values in the table  
below are defined as follows:  
• Page-to-page response time is an average of all possible page-to-page accesses for a sequentially preconditioned  
drive.  
• Average response time is a true statistical random average of at least 5000 measurements of accesses between pro-  
grammable pages on a randomly preconditioned drive.  
Table 2 Typical Response Time (μsec)  
1 2  
,
ALL CAPACITIES  
READ  
WRITE  
Average  
192  
39  
45  
44  
13  
3
Page to Page  
Average Latency  
Typical  
183  
1.  
2.  
3.  
Execution time measured from receipt of the Command to the Response.  
Assumes no errors.  
Typical response times are measured under nominal conditions of temperature and voltage as measured on a representative  
sample of drives.  
These drives are designed to provide the highest possible performance under typical conditions. How-  
ever, due to the nature of Flash memory technologies there are many factors that can result in  
values different than those stated in this specification  
2.  
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4.2.2 FORMAT UNIT command execution time for 512-byte LBA’s (minutes)  
The device may be formatted as either a Thin Provisioned device or a Fully Provisioned device. The default format is Thin  
Provisioned and is recommended for most applications. Thin Provisioning provides the most flexibility for the device to  
manage the flash medium to maximize endurance.  
Table 3 Maximum FORMAT UNIT Times (minutes)  
Format Mode  
DCRT Bit IP Bit 800GB 400GB 200GB 100GB  
CONFIGURATION  
Non-SED  
Non-SED  
Non-SED  
Non-SED  
SED  
(Default) Thin Provisioned  
(Default) Thin Provisioned  
Fully Provisioned  
DCRT = 0  
DCRT = 1  
DCRT = 0  
DCRT = 1  
DCRT = 0  
DCRT = 1  
DCRT = 0  
DCRT = 1  
IP = 0  
IP = 0  
IP = 1  
IP = 1  
IP = 0  
IP = 0  
IP = 1  
IP = 1  
5
5
5
5
5
5
5
5
10  
10  
5
10  
10  
5
10  
10  
5
10  
10  
5
Fully Provisioned  
(Default) Thin Provisioned  
(Default) Thin Provisioned  
Fully Provisioned  
SED  
5
5
5
5
SED  
430  
280  
430  
280  
430  
280  
430  
280  
SED  
Fully Provisioned  
4.2.3 Performance  
ST800FM0013  
ST800FM0023  
ST800FM0033  
Standard 2.5” Models -  
Managed Life  
ST400FM0013  
ST400FM0033  
ST200FM0013  
ST200FM0033  
Notes  
Maximum Burst Transfer Rate  
1200MB/s  
Peak sequential 128KB read/write  
data transfer rate (MB/s max)  
[1]  
[1]  
[2]  
[2]  
750/500  
750/400  
750/45  
Sustained sequential 128KB read/  
write data transfer rate (MB/s)  
750/195  
750/95  
Peak 4KB random read/write  
command rate (IOPs)  
110,000/30,000  
110,000/25,000  
110,000/3700  
Sustained 4KB random read/write  
command rate (IOPs)  
110,000/15,000  
110,000/7500  
Sustainable 4KB Random combined  
IOPS for 5 year Endurance  
(65%/35% R/W, 70% Duty Cycle)  
[3]  
60,000  
50,000  
ST800FM0043  
ST800FM0053  
ST800FM0063  
Standard 2.5” Models -  
Limited Warranty with Media Usage  
ST400FM0053  
ST400FM0073  
ST200FM0053  
ST200FM0073  
Notes  
Maximum Burst Transfer Rate  
1200MB/s  
Peak sequential 128KB read/write  
data transfer rate (MB/s max)  
[1]  
[1]  
[2]  
[2]  
750/500  
750/400  
Sustained sequential 128KB read/  
write data transfer rate (MB/s)  
Peak 4KB random read/write  
command rate (IOPs)  
110,000/30,000  
60,000  
110,000/25,000  
50,000  
Sustained 4KB random read/write  
command rate (IOPs)  
Sustainable 4KB Random combined  
IOPS for 5 year Endurance  
(65%/35% R/W, 70% Duty Cycle)  
[3]  
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Standard 1.8” Models -  
Managed Life  
ST400FM0023  
ST400FM0043  
ST200FM0023  
ST200FM0043  
Notes  
Maximum Burst Transfer Rate  
600MB/s  
550/500  
Peak sequential 128KB read/write  
data transfer rate (MB/s max)  
[1]  
[1]  
[2]  
[2]  
Sustained sequential 128KB read/  
write data transfer rate (MB/s)  
550/195  
110,000/30,000  
110,000/15,000 110,000/7500  
550/95  
Peak 4KB random read/write  
command rate (IOPs)  
Sustained 4KB random read/write  
command rate (IOPs)  
Sustainable 4KB Random combined  
IOPS for 5 year Endurance  
(65%/35% R/W, 70% Duty Cycle)  
[3]  
60,000  
Standard 1.8” Models -  
Limited Warranty with Media Usage  
ST400FM0063  
ST400FM0083  
ST200FM0063  
ST200FM0083  
Notes  
Maximum Burst Transfer Rate  
600MB/s  
Peak sequential 128KB read/write  
data transfer rate (MB/s max)  
[1]  
[1]  
[2]  
[2]  
550/500  
Sustained sequential 128KB read/  
write data transfer rate (MB/s)  
Peak 4KB random read/write  
command rate (IOPs)  
110,000/30,000  
60,000  
Sustained 4KB random read/write  
command rate (IOPs)  
Sustainable 4KB Random combined  
IOPS for 5 year Endurance  
(65%/35% R/W, 70% Duty Cycle)  
[3]  
High Endurance 2.5” Models -  
Managed Life  
ST400FM0113  
ST400FM0123  
ST200FM0113  
ST200FM0123  
ST100FM0113  
ST100FM0123  
Notes  
Maximum Burst Transfer Rate  
1200MB/s  
Peak sequential 128KB read/write  
data transfer rate (MB/s max)  
[1]  
[1]  
[2]  
[2]  
750/500  
750/400  
750/45  
Sustained sequential 128KB read/  
write data transfer rate (MB/s)  
750/195  
750/95  
Peak 4KB random read/write  
command rate (IOPs)  
110,000/50,000  
110,000/50,000  
110,000/3700  
Sustained 4KB random read/write  
command rate (IOPs)  
110,000/15,000  
110,000/7500  
Sustainable 4KB Random combined  
IOPS for 5 year Endurance  
(65%/35% R/W, 70% Duty Cycle)  
[3]  
70,000  
60,000  
SEAGATE 1200 SSD PRODUCT MANUAL, REV. A  
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High Endurance 2.5” Models -  
Limited Warranty with Media Usage  
ST400FM0093  
ST400FM0103  
ST200FM0093  
ST200FM0103  
ST100FM0093  
ST100FM0103  
Notes  
Maximum Burst Transfer Rate  
1200MB/s  
Peak sequential 128KB read/write  
data transfer rate (MB/s max)  
[1]  
[1]  
[2]  
[2]  
750/500  
750/400  
Sustained sequential 128KB read/  
write data transfer rate (MB/s)  
Peak 4KB random read/write  
command rate (IOPs)  
110,000/50,000  
70,000  
110,000/50,000  
60,000  
Sustained 4KB random read/write  
command rate (IOPs)  
Sustainable 4KB Random combined  
IOPS for 5 year Endurance  
(65%/35% R/W, 70% Duty Cycle)  
[3]  
[1] Testing performed at Queue Depth = 128, Sequentially Preconditioned drive, using IOMeter 2006.7.27.  
[2] Testing performed at Queue Depth = 128, Randomly Preconditioned drive, using IOMeter 2006.7.27.  
[3] Testing performed at Queue Depth = 128, Non-Preconditioned drive, using IOMeter 2006.7.27.  
IOMeter is licensed under the Intel Open Source License and the GNU General Public License. Intel does not  
endorse any IOMeter results.  
Peak performance is defined as the typical best case performance that the product will be able to achieve when  
the product is preconditioned as mentioned and host commands are aligned on 4KB boundaries.  
Sustained performance is defined as the worst case performance that the product will be able to achieve when the product is  
preconditioned as mentioned and host commands are aligned on 4KB boundaries. For models that support Lifetime  
Endurance Management, write values also take into account the worst case performance throttling that may occur to ensure  
the product meets specified reliability specifications.  
Due to the nature of Flash memory technologies there are many factors that can result in values different than those stated  
in this specification. Some discrepancies can be caused by bandwidth limitations in the host adapter, operating system, or  
driver limitations. It is not the intent of this manual to cover all possible causes of performance discrepancies.  
When evaluating performance of SSD devices, it is recommended to measure performance of the device in a method that  
resembles the targeted application using real world data and workloads. Test time should also be adequately large to ensure  
that sustainable metrics and measures are obtained.  
4.3  
START/STOP TIME  
The drive accepts the commands listed in the SAS Interface Manual less than 3 seconds after DC power has been applied.  
If the drive receives a NOTIFY (ENABLE SPINUP) primitive through either port and has not received a START STOP UNIT  
command with the START bit equal to 0, the drive becomes ready for normal operations within 10 seconds (excluding the  
error recovery procedure).  
If the drive receives a START STOP UNIT command with the START bit equal to 0 before receiving a NOTIFY (ENABLE  
SPINUP) primitive, the drive waits for a START STOP UNIT command with the START bit equal to 1. After receiving a  
START STOP UNIT command with the START bit equal to 1, the drive waits for a NOTIFY (ENABLE SPINUP) primitive.  
After receiving a NOTIFY (ENABLE SPINUP) primitive through either port, the drive becomes ready for normal operations  
within 10 seconds (excluding the error recovery procedure).  
If the drive receives a START STOP UNIT command with the START bit and IMMED bit equal to 1 and does not receive a  
NOTIFY (ENABLE SPINUP) primitive within 5 seconds, the drive fails the START STOP UNIT command.  
The START STOP UNIT command may be used to command the drive to stop. Stop time is 3 seconds (maximum) from  
removal of DC power. SCSI stop time is 3 seconds. There is no power control switch on the drive.  
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4.4  
CACHE CONTROL  
All default cache mode parameter values (Mode Page 08h) for standard OEM versions of this drive family are given in  
4.4.1 Caching write data  
Write caching is a write operation by the drive that makes use of a drive buffer storage area where the data to be written to  
the medium is stored while the drive performs the WRITE command.  
If the number of write data logical blocks exceed the size of the segment being written into, when the end of the segment is  
reached, the data is written into the beginning of the same cache segment, overwriting the data that was written there at the  
beginning of the operation; however, the drive does not overwrite data that has not yet been written to the medium.  
If write caching is enabled (WCE=1), then the drive may return Good status on a WRITE command after the data has been  
transferred into the cache, but before the data has been written to the medium. If an error occurs while writing the data to the  
medium, and Good status has already been returned, a deferred error will be generated.  
Data that has not been written to the medium is protected by a back up power source which provides the ability of the data to  
be written to non-volatile medium in the event of an unexpected power loss.  
The SYNCHRONIZE CACHE command may be used to force the drive to write all cached write data to the medium. Upon  
completion of a SYNCHRONIZE CACHE command, all data received from previous WRITE commands will have been  
4.4.2 Prefetch operation  
If the Prefetch feature is enabled, data in contiguous logical blocks on the medium immediately beyond that which was  
requested by a Read command are retrieved and stored in the buffer for immediate transfer from the buffer to the host on  
subsequent Read commands that request those logical blocks (this is true even if cache operation is disabled). Though the  
prefetch operation uses the buffer as a cache, finding the requested data in the buffer is a prefetch hit, not a cache operation  
hit.  
To enable Prefetch, use Mode Select page 08h, byte 12, bit 5 (Disable Read Ahead - DRA bit). DRA bit = 0 enables prefetch.  
The drive does not use the Max Prefetch field (bytes 8 and 9) or the Prefetch Ceiling field (bytes 10 and 11).  
When prefetch (read look-ahead) is enabled (enabled by DRA = 0), the drive enables prefetch of contiguous blocks from the  
medium when it senses that a prefetch hit will likely occur. The drive disables prefetch when it decides that a prefetch hit is  
not likely to occur.  
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5.0 RELIABILITY SPECIFICATIONS  
The following reliability specifications assume correct host and drive operational interface, including all interface timings,  
power supply voltages, environmental requirements and drive mounting constraints.  
1
Read Error Rates  
Unrecovered Data  
Miscorrected Data  
Less than 1 LBA in 1016 bits transferred  
Less than 1 LBA in 1021 bits transferred  
Less than 1 error in 1012 bits transferred  
Interface error rate:  
Mean Time Between Failure (MTBF): 2,000,000 hours  
Annualized Failure Rate (AFR):  
Preventive maintenance:  
0.44%  
None required  
3 months  
Typical Data Retention with  
2
Power removed (at 40C)  
4
Endurance Rating:  
Method 1: Full drive writes per day 10 (all standard models)  
25 (only High Endurance models)  
Method 2: TBW (per JEDEC JESD218)  
ST400FM0093, ST400FM0103 = 18,250 TB  
ST400FM0113, ST400FM0123 = 18,250 TB  
ST800FM0013, ST800FM0023, ST800FM0033 = 14,600 TB  
ST800FM0043, ST800FM0053, ST800FM0063 = 14,600 TB  
ST200FM0093, ST200FM0103 = 9125 TB  
ST200FM0113, ST200FM0123 = 9125 TB  
ST400FM0013, ST400FM0023, ST400FM0033 = 7300 TB  
ST400FM0043, ST400FM0053, ST400FM0063 = 7300 TB  
ST400FM0073, ST400FM0083 = 7300 TB  
ST100FM0093, ST100FM0103 = 4562.5 TB  
ST100FM0113, ST100FM0123 = 4562.5 TB  
ST200FM0013, ST200FM0023, ST200FM0033 = 3650 TB  
ST200FM0043, ST200FM0053, ST200FM0063 = 3650 TB  
ST200FM0073, ST200FM0083 = 3650 TB  
1. Error rate specified with automatic retries and data correction with ECC enabled and all flaws reallocated.  
2. As NAND Flash devices age with use, the capability of the media to retain a programmed value begins to deteriorate.  
This deterioration is affected by the number of times a particular memory cell is programmed and subsequently erased.  
When a device is new, it has a powered off data retention capability of up to several years. With use the retention capa-  
bility of the device is reduced. Temperature also has an effect on how long a Flash component can retain its programmed  
value with power removed. At high temperature the retention capabilities of the device are reduced. Data retention is  
not an issue with power applied to the SSD. The SSD drive contains firmware and hardware features that can monitor  
and refresh memory cells when power is applied.  
3. Endurance rating is the expected amount of host data that can be written by product when subjected to a specified work-  
load at a specified operating and storage temperature. For the specific workload to achieve this level of endurance,  
12  
please reference JEDEC Specification JESD218. TBW is defined as 1x10 Bytes.  
4. Limited Warranty with Media Usage provides coverage for the warranty period or until the SSD Percentage Used  
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5.1  
ERROR RATES  
The error rates stated in this manual assume the following:  
• The drive is operated in accordance with this manual using DC power as defined in paragraph 6.3, "DC power require-  
• Errors caused by host system failures are excluded from error rate computations.  
• Assume random data.  
• Default OEM error recovery settings are applied. This includes AWRE, ARRE, full read retries, full write retries and full retry  
time.  
5.1.1 Unrecoverable Errors  
An unrecoverable data error is defined as a failure of the drive to recover data from the media. These errors occur due to  
read or write problems. Unrecoverable data errors are only detected during read operations, but not caused by the read. If an  
unrecoverable data error is detected, a MEDIUM ERROR (03h) in the Sense Key will be reported. Multiple unrecoverable  
data errors resulting from the same cause are treated as 1 error.  
5.1.2 Interface errors  
An interface error is defined as a failure of the receiver on a port to recover the data as transmitted by the device port  
connected to the receiver. The error may be detected as a running disparity error, illegal code, loss of word sync, or CRC  
error.  
5.2  
ENDURANCE MANAGEMENT  
Customer satisfaction with Solid State Drives can be directly related to the internal algorithms which an SSD uses to manage  
the limited number of Program-Erase (PE) cycles that NAND Flash can withstand. These algorithms consist of Wearleveling,  
Garbage Collection, Write Amplification, Unmap, Data Retention, Lifetime Endurance Management.  
5.2.1 Wear Leveling  
Wear Leveling is a technique used by the drive to ensure that all Flash cells are written to or exercised as evenly as possible  
to avoid any hot spots where some cells are used up faster than other locations. Wear Leveling is automatically managed by  
the drive and requires no user interaction. The Seagate algorithm is tuned to operate only when needed to ensure reliable  
product operation.  
5.2.2 Garbage Collection  
Garbage Collection is a technique used by the drive to consolidate valid user data into a common cell range freeing up  
unused or obsolete locations to be erased and used for future storage needs. Garbage Collection is automatically managed  
by the drive and requires no user interaction. The Seagate algorithm is tuned to operate only when needed to ensure reliable  
product operation.  
5.2.3 Write Amplification  
While Write Amplification is not an algorithm, it is a major characteristic of SSD's that must be accounted for by all the  
algorithms that the SSD implements. The Write Amplification Factor of an SSD is defined as the ratio of Host/User data  
requested to be written to the actual amount of data written by the SSD internal to account for the user data and the  
housekeeping activities such as Wear Leveling and Garbage Collection. The Write Amplification Factor of an SSD can also  
be directly affected by the characteristics of the host data being sent to the SSD to write. The best Write Amplification Factor  
is achieved for data that is written in sequential LBA's that are aligned on 4KB boundaries. The worst case Write  
Amplification Factor typically occurs for randomly written LBA's of transfer sizes that are less than 4KB and that originate on  
LBA's that are not on 4KB boundaries.  
5.2.4 UNMAP  
A new SCSI command has been added to the SSD as part of the Thin Provisioning feature set. Use of the UNMAP  
command reduces the Write Amplification Factor of the drive during housekeeping tasks such as Wear Leveling and  
Garbage Collection. This is accomplished because the drive does not need to retain data which has been classified by the  
host as obsolete.  
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5.2.5 Data Retention  
Data Retention is another major characteristic of SSD's that must be accounted for by all the algorithms that the SSD  
implements. While powered up, the Data Retention of SSD cells are monitored and rewritten if the cell levels decay to an  
unexpected level. Data Retention when the drive is powered off is affected by Program and Erase (PE) cycles and the  
temperature of the drive when stored.  
5.2.6 Lifetime Endurance Management (Available on select models)  
As stated in Section 5.2, an SSD has a limited number of Program and Erase (PE) cycles that are capable. In worse case  
applications, the write workload could be such that the drive experiences a high Write Amplification Factor that could lead to  
potential wear out prior to the drive achieving it's expected field life. Additionally, the Data Retention spec of the SSD needs  
to be considered to ensure the spec is met once the drive is worn out. Seagate has implemented a Lifetime Endurance  
Management technique which helps OEMS and user to avoid early wear out. By monitoring the write workload being sent to  
the drive, the drive can add additional response time to WRITE commands to provide a sustainable level of performance that  
is capable of being sustained for the life of the drive. Most users may never see this added response time in their  
applications.  
5.2.7 SSD Percentage Used Endurance Indicator  
An application can interrogate the drive through the host to determine an estimate of the percentage of device life that has  
been used. To accomplish this, issue a LOG SENSE command to log page 0x11. This allows applications to read the  
contents of the Percentage Used Endurance Indicator parameter code. The Percentage Used Endurance Indicator is defined  
in the T10 document SBC-3 available from the T10 committee.  
5.3  
RELIABILITY AND SERVICE  
Integrators can enhance the reliability of Seagate 1200 SSD drives by ensuring that the drive receives adequate cooling.  
5.3.1 Annualized Failure Rate (AFR) and Mean Time Between Failure (MTBF)  
The production drive shall achieve an AFR of 0.44% (MTBF of 2,000,000 hours) when operated in an environment that  
ensures the case temperatures do not exceed the values specified in Section 6.5. Operation at case temperatures outside  
the specifications in Section 6.5 may increase the product AFR (decrease the MTBF). The AFR (MTBF) is a population  
statistic not relevant to individual units.  
The AFR (MTBF) specification is based on the following assumptions for Enterprise Storage System environments:  
• 8760 power-on hours per year.  
• 250 average on/off cycles per year.  
• Operations at nominal voltages.  
• Systems will provide adequate cooling to ensure the case temperatures specified in Section 6.5 are not exceeded. Tem-  
peratures outside the specifications in Section 6.5 will increase the product AFR and decrease the MTBF.  
5.3.2 Preventive maintenance  
No routine scheduled preventive maintenance is required.  
5.3.3 Hot plugging the drive  
When a drive is powered on by switching the power or hot plugged, the drive runs a self test before attempting to  
communicate on its’ interfaces. When the self test completes successfully, the drive initiates a Link Reset starting with OOB.  
An attached device should respond to the link reset. If the link reset attempt fails, or any time the drive looses sync, the drive  
initiated link reset. The drive will initiate link reset once per second but alternates between port A and B. Therefore each port  
will attempt a link reset once per 2 seconds assuming both ports are out of sync.  
If the self-test fails, the drive does not respond to link reset on the failing port.  
Note. It is the responsibility of the systems integrator to assure that no temperature, energy, voltage hazard, or ESD  
potential hazard is presented during the hot connect/disconnect operation. Discharge the static electricity from  
the drive carrier prior to inserting it into the system.  
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5.3.4 S.M.A.R.T.  
S.M.A.R.T. is an acronym for Self-Monitoring Analysis and Reporting Technology. This technology is intended to recognize  
conditions that indicate imminent drive failure and is designed to provide sufficient warning of a failure to allow administrators  
to back up the data before an actual failure occurs.  
Note. The drive’s firmware monitors specific attributes for degradation over time but can’t predict instantaneous drive  
failures.  
Each monitored attribute has been selected to monitor a specific set of failure conditions in the operating performance of the  
drive and the thresholds are optimized to minimize “false” and “failed” predictions.  
Controlling S.M.A.R.T.  
The operating mode of S.M.A.R.T. is controlled by the DEXCPT and PERF bits on the Informational Exceptions Control  
mode page (1Ch). Use the DEXCPT bit to enable or disable the S.M.A.R.T. feature. Setting the DEXCPT bit disables all  
S.M.A.R.T. functions. When enabled, S.M.A.R.T. collects on-line data as the drive performs normal read and write  
operations. When the PERF bit is set, the drive is considered to be in “On-line Mode Only” and will not perform off-line  
functions.  
An application can measure off-line attributes and force the drive to save the data by using the REZERO UNIT command.  
Forcing S.M.A.R.T. resets the timer so that the next scheduled interrupt is in one hour.  
An application can interrogate the drive through the host to determine the time remaining before the next scheduled  
measurement and data logging process occurs. To accomplish this, issue a LOG SENSE command to log page 0x3E. This  
allows applications to control when S.M.A.R.T. interruptions occur. Forcing S.M.A.R.T. with the REZERO UNIT command  
resets the timer.  
Performance impact  
S.M.A.R.T. attribute data is saved to the media so that the events that caused a predictive failure can be recreated. The drive  
measures and saves parameters once every hour subject to an idle period on the drive interfaces. The process of measuring  
off-line attribute data and saving data to the media is interruptible. The maximum on-line only processing delay is  
summarized below  
Table 1:  
Maximum processing delay  
Fully-enabled delay  
DEXCPT = 0  
S.M.A.R.T. delay times  
75 ms  
Reporting control  
Reporting is controlled by the MRIE bits in the Informational Exceptions Control mode page (1Ch). Subject to the reporting  
method. For example, if the MRIE is set to one, the firmware will issue to the host an 01-5D00 sense code. The FRU field  
contains the type of predictive failure that occurred. The error code is preserved through bus resets and power cycles.  
Determining rate  
S.M.A.R.T. monitors the rate at which errors occur and signals a predictive failure if the rate of degraded errors increases to  
an unacceptable level. To determine rate, error events are logged and compared to the number of total operations for a given  
attribute. The interval defines the number of operations over which to measure the rate. The counter that keeps track of the  
current number of operations is referred to as the Interval Counter.  
S.M.A.R.T. measures error rates. All errors for each monitored attribute are recorded. A counter keeps track of the number of  
errors for the current interval. This counter is referred to as the Failure Counter.  
Error rate is the number of errors per operation. The algorithm that S.M.A.R.T. uses to record rates of error is to set  
thresholds for the number of errors and appropriate interval. If the number of errors exceeds the threshold before the interval  
expires, the error rate is considered to be unacceptable. If the number of errors does not exceed the threshold before the  
interval expires, the error rate is considered to be acceptable. In either case, the interval and failure counters are reset and  
the process starts over.  
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Predictive failures  
S.M.A.R.T. signals predictive failures when the drive is performing unacceptably for a period of time. The firmware keeps a  
running count of the number of times the error rate for each attribute is unacceptable. To accomplish this, a counter is  
incremented each time the error rate is unacceptable and decremented (not to exceed zero) whenever the error rate is  
acceptable. If the counter continually increments such that it reaches the predictive threshold, a predictive failure is signaled.  
This counter is referred to as the Failure History Counter. There is a separate Failure History Counter for each attribute.  
5.3.5 Thermal monitor  
Seagate 1200 SSD drives implement a temperature warning system which:  
1. Signals the host if the temperature exceeds a value which would threaten the drive.  
2. Signals the host if the temperature exceeds a user-specified value. (i.e., the reference temperature value)  
3. Saves a S.M.A.R.T. data frame on the drive which exceeds the threatening temperature value.  
A temperature sensor monitors the drive temperature and issues a warning over the interface when the temperature  
exceeds a set threshold. The temperature is measured at power-up and then at ten-minute intervals after power-up.  
The thermal monitor system generates a warning code of 01-0B01 when the temperature exceeds the specified limit in  
compliance with the SCSI standard.  
This feature is controlled by the Enable Warning (EWasc) bit, and the reporting mechanism is controlled by the Method of  
Reporting Informational Exceptions field (MRIE) on the Informational Exceptions Control (IEC) mode page (1Ch).  
5.3.6 Drive Self Test (DST)  
Drive Self Test (DST) is a technology designed to recognize drive fault conditions that qualify the drive as a failed unit. DST  
validates the functionality of the drive at a system level.  
There are two test coverage options implemented in DST:  
1. Extended test  
2. Short test  
The most thorough option is the extended test that performs various tests on the drive and scans every logical block address  
(LBA) of the drive. The short test is time-restricted and limited in length—it does not scan the entire media contents, but does  
some fundamental tests and scans portions of the media.  
If DST encounters an error during either of these tests, it reports a "diagnostic failed" condition. If the drive fails the test,  
remove it from service and return it to Seagate for service.  
5.3.6.1 DST failure definition  
The drive will present a “diagnostic failed” condition through the self-tests results value of the diagnostic log page if a  
functional failure is encountered during DST. The drive parameters are not modified to test the drive more stringently, and the  
recovery capabilities are not reduced. All retries and recovery processes are enabled during the test. If data is recoverable,  
no failure condition will be reported regardless of the recovery processes required to recover the data.  
The following conditions are considered DST failure conditions:  
• Read error after recovery attempts are exhausted  
• Write error after recovery attempts are exhausted  
Recovered errors will not be reported as diagnostic failures.  
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5.3.6.2 Implementation  
This section provides all of the information necessary to implement the DST function on this drive.  
5.3.6.2.1  
State of the drive prior to testing  
The drive must be in a ready state before issuing the SEND DIAGNOSTIC command. There are multiple reasons why a  
drive may not be ready, some of which are valid conditions, and not errors. For example, a drive may be in process of doing  
a FORMAT UNIT, or another DST. It is the responsibility of the host application to determine the “not ready” cause.  
5.3.6.2.2  
Invoking DST  
To invoke DST, submit the SEND DIAGNOSTIC command with the appropriate Function Code (001b for the short test or  
010b for the extended test) in bytes 1, bits 5, 6, and 7.  
5.3.6.2.3  
Short and extended tests  
DST has two testing options:  
1. short  
2. extended  
These testing options are described in the following two subsections.  
Each test consists of two segments: an electrical test segment and a read/verify scan segment.  
Short test (Function Code: 001b)  
The purpose of the short test is to provide a time-limited test that tests as much of the drive as possible within 120 seconds.  
The short test does not scan the entire media contents, but does some fundamental tests and scans portions of the media. A  
complete read/verify scan is not performed and only factual failures will report a "diagnostic failed" condition. This option  
provides a quick confidence test of the drive.  
Extended test (Function Code: 010b)  
The objective of the extended test option is to empirically test critical drive components. The read operation tests the media  
contents. The integrity of the media is checked through a read/verify scan of the media.  
The anticipated length of the Extended test is reported through the Control Mode page.  
5.3.6.2.4  
Log page entries  
When the drive begins DST, it creates a new entry in the Self-test Results Log page. The new entry is created by inserting a  
new self-test parameter block at the beginning of the self-test results log parameter section of the log page. Existing data will  
be moved to make room for the new parameter block. The drive reports 20 parameter blocks in the log page. If there are  
more than 20 parameter blocks, the least recent parameter block will be deleted. The new parameter block will be initialized  
as follows:  
1. The Function Code field is set to the same value as sent in the DST command  
2. The Self-Test Results Value field is set to Fh  
3. The drive will store the log page to non-volatile memory  
After a self-test is complete or has been aborted, the drive updates the Self-Test Results Value field in its Self-Test Results  
Log page in non-volatile memory. The host may use LOG SENSE to read the results from up to the last 20 self-tests  
performed by the drive. The self-test results value is a 4-bit field that reports the results of the test. If the field is set to zero,  
the drive passed with no errors detected by the DST. If the field is not set to zero, the test failed for the reason reported in the  
field.  
The drive will report the failure condition and LBA (if applicable) in the Self-test Results Log parameter. The Sense key, ASC,  
ASCQ, and FRU are used to report the failure condition.  
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5.3.6.2.5  
Abort  
There are several ways to abort a diagnostic. Applications can use a SCSI Bus Reset or a Bus Device Reset message to  
abort the diagnostic.  
Applications can abort a DST executing in background mode by using the abort code in the DST Function Code field. This  
will cause a 01 (self-test aborted by the application client) code to appear in the self-test results values log. All other abort  
mechanisms will be reported as a 02 (self-test routine was interrupted by a reset condition).  
5.3.7 Product warranty  
Warranty terms will vary based on type of warranty chosen: “Managed Life Warranty” or “Limited Warranty with Media  
Usage”. Consult the Seagate sales representative for warranty terms and conditions.  
Managed Life  
This warranty is term based and includes the Lifetime Endurance Management feature stated in section 6.2.6.  
Limited Warranty with Media Usage  
This warranty is based on the shorter of term and endurance usage of the drive.  
Shipping  
When transporting or shipping a drive, use only a Seagate-approved container. Keep the original box. Seagate approved  
containers are easily identified by the Seagate Approved Package label. Shipping a drive in a non-approved container voids  
the drive warranty.  
Seagate repair centers may refuse receipt of components improperly packaged or obviously damaged in transit. Contact the  
authorized Seagate distributor to purchase additional boxes. Seagate recommends shipping by an air-ride carrier  
experienced in handling computer equipment.  
Product repair and return information  
Seagate customer service centers are the only facilities authorized to service Seagate drives. Seagate does not sanction  
any third-party repair facilities. Any unauthorized repair or tampering with the factory seal voids the warranty.  
Storage  
The maximum recommended storage period for the drive in a non-operational environment is 90 days. Drives should be  
stored in the original unopened Seagate shipping packaging when ever possible. Once the drive is removed from the  
Seagate original packaging the recommended maximum period between drive operation cycles is 30 days. During any  
storage period the drive non-operational temperature, humidity, wet bulb, atmospheric conditions, shock, vibration, magnetic  
and electrical field specifications should be followed.  
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6.0 PHYSICAL/ELECTRICAL SPECIFICATIONS  
This section provides information relating to the physical and electrical characteristics of the drive.  
6.1  
POWER SPECIFICATIONS  
The 2.5” drive receives DC power (+5V and +12V) through the standard SAS interface.  
The 1.8" drive receives DC power (+3.3V and +5V) through the standard micro-SAS interface.  
6.1.1 Power consumption  
Power requirements for the drives are listed in the tables in Section 6.3. Typical power measurements are based on an  
average of drives tested, under nominal conditions, using the listed input voltage at 60°C ambient temperature.  
Measurements are made at 6Gb interface speeds. For 12Gb interface speed add 1W of total power to the values shown.  
• Startup power  
Startup power is measured from the time of power-on to the time that the drive reaches operating condition and can pro-  
cess media access commands.  
• Peak operating mode  
During peak operating mode, the drive is tested in various read and write access patterns to simulate the worst-case  
power consumption.  
• Idle mode power  
Idle mode power is measured with the drive powered up and ready for media access commands, with no media access  
commands having been received from the host.  
6.2  
AC POWER REQUIREMENTS  
None.  
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6.3  
DC POWER REQUIREMENTS  
Table 4 800GB standard 2.5” model DC power requirements  
(Models ST800FM0013, ST800FM0023, ST800FM0033, ST800FM0043, ST800FM0053, ST800FM0063)  
PARAMETER  
800GB (6.0Gb)  
[4]  
[2]  
[2]  
Regulation  
Voltage  
±5%  
+5V  
±5%  
+12V  
CURRENT (A) CURRENT (A) POWER (W)  
[1]  
DC  
Average idle current  
0.42  
0.10  
3.30  
Maximum starting current  
(peak DC) DC  
3σ  
3σ  
3σ  
0.64  
0.83  
0.43  
0.38  
0.49  
0.02  
(peak AC) AC  
[1] [3]  
Delayed start (max) DC  
2.39  
Peak operating current (random read):  
[1]  
Typical DC  
DC  
3σ  
0.45  
0.49  
0.88  
0.15  
0.18  
0.47  
4.05  
4.61  
[1]  
Maximum DC  
Maximum (peak) DC  
Peak operating current (random write)  
Typical DC  
3σ  
DC  
3σ  
0.46  
0.51  
0.78  
0.25  
0.40  
0.86  
5.30  
7.35  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential read)  
Typical DC  
3σ  
DC  
3σ  
0.49  
0.52  
0.91  
0.19  
0.20  
0.54  
4.73  
5.00  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential write)  
Typical DC  
3σ  
DC  
3σ  
0.49  
0.53  
0.77  
0.37  
0.41  
0.85  
6.89  
7.57  
Maximum DC  
Maximum (peak) DC  
3σ  
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Table 5 400GB standard 2.5” model DC power requirements  
(Models ST400FM0013, ST400FM0033, ST400FM0053, ST400FM0073)  
PARAMETER  
400GB (6.0Gb)  
[4]  
[2]  
[2]  
Regulation  
Voltage  
±5%  
+5V  
±5%  
+12V  
CURRENT (A) CURRENT (A) POWER (W)  
[1]  
DC  
Average idle current  
0.40  
0.06  
2.72  
Maximum starting current  
(peak DC) DC  
3σ  
3σ  
3σ  
0.57  
0.74  
0.41  
0.29  
0.62  
0.02  
(peak AC) AC  
[1] [3]  
Delayed start (max) DC  
2.29  
Peak operating current (random read):  
[1]  
Typical DC  
DC  
3σ  
0.43  
0.46  
0.65  
0.13  
0.14  
0.32  
3.71  
3.98  
[1]  
Maximum DC  
Maximum (peak) DC  
Peak operating current (random write)  
Typical DC  
3σ  
DC  
3σ  
0.44  
0.48  
0.95  
0.21  
0.24  
0.74  
4.72  
5.28  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential read)  
Typical DC  
3σ  
DC  
3σ  
0.47  
0.49  
0.72  
0.17  
0.18  
0.42  
4.39  
4.61  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential write)  
Typical DC  
3σ  
DC  
3σ  
0.47  
0.49  
1.04  
0.33  
0.34  
0.69  
6.31  
6.53  
Maximum DC  
Maximum (peak) DC  
3σ  
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Table 6 200GB standard 2.5” model DC power requirements  
(Models ST200FM0013, ST200FM0033, ST200FM0053, ST200FM0073)  
PARAMETER  
200GB (6.0Gb)  
[4]  
[2]  
[2]  
Regulation  
Voltage  
±5%  
+5V  
±5%  
+12V  
CURRENT (A) CURRENT (A) POWER (W)  
[1]  
DC  
Average idle current  
0.41  
0.07  
2.89  
Maximum starting current  
(peak DC) DC  
3σ  
3σ  
3σ  
0.65  
0.74  
0.46  
0.34  
0.55  
0.02  
(peak AC) AC  
[1] [3]  
Delayed start (max) DC  
2.54  
Peak operating current (random read):  
[1]  
Typical DC  
DC  
3σ  
0.45  
0.51  
0.97  
0.14  
0.17  
0.32  
3.93  
4.59  
[1]  
Maximum DC  
Maximum (peak) DC  
Peak operating current (random write)  
Typical DC  
3σ  
DC  
3σ  
0.47  
0.54  
0.77  
0.22  
0.31  
0.58  
4.99  
6.42  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential read)  
Typical DC  
3σ  
DC  
3σ  
0.48  
0.56  
0.73  
0.18  
0.18  
0.45  
4.56  
4.96  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential write)  
Typical DC  
3σ  
DC  
3σ  
0.47  
0.54  
0.75  
0.26  
0.27  
0.64  
5.47  
5.94  
Maximum DC  
Maximum (peak) DC  
3σ  
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Table 7 400GB high endurance 2.5” model DC power requirements  
(Models ST400FM0093, ST400FM0103, ST400FM0113, ST400FM0123)  
PARAMETER  
400GB HIGH ENDURANCE (6.0Gb)  
[4]  
[2]  
Regulation  
Voltage  
±5%  
+5V  
±5%  
[2]  
+12V  
CURRENT (A) CURRENT (A) POWER (W)  
[1]  
DC  
Average idle current  
0.42  
0.10  
3.30  
Maximum starting current  
(peak DC) DC  
3σ  
3σ  
3σ  
0.64  
0.83  
0.43  
0.38  
0.49  
0.02  
(peak AC) AC  
[1] [3]  
Delayed start (max) DC  
2.39  
Peak operating current (random read):  
[1]  
Typical DC  
DC  
3σ  
0.45  
0.49  
0.88  
0.15  
0.18  
0.47  
4.05  
4.61  
[1]  
Maximum DC  
Maximum (peak) DC  
Peak operating current (random write)  
Typical DC  
3σ  
DC  
3σ  
0.49  
0.53  
0.78  
0.37  
0.41  
0.86  
6.89  
7.57  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential read)  
Typical DC  
3σ  
DC  
3σ  
0.49  
0.52  
0.91  
0.19  
0.20  
0.54  
4.73  
5.00  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential write)  
Typical DC  
3σ  
DC  
3σ  
0.49  
0.53  
0.77  
0.37  
0.41  
0.85  
6.89  
7.57  
Maximum DC  
Maximum (peak) DC  
3σ  
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Table 8 200GB high endurance 2.5” model DC power requirements  
(Models ST200FM0093, ST200FM0103, ST200FM0113, ST200FM0123)  
PARAMETER  
200GB HIGH ENDURANCE (6.0Gb)  
[4]  
[2]  
Regulation  
Voltage  
±5%  
+5V  
±5%  
[2]  
+12V  
CURRENT (A) CURRENT (A) POWER (W)  
[1]  
DC  
Average idle current  
0.40  
0.06  
2.72  
Maximum starting current  
(peak DC) DC  
3σ  
3σ  
3σ  
0.57  
0.74  
0.41  
0.29  
0.62  
0.02  
(peak AC) AC  
[1] [3]  
Delayed start (max) DC  
2.29  
Peak operating current (random read):  
[1]  
Typical DC  
DC  
3σ  
0.43  
0.46  
0.65  
0.13  
0.14  
0.32  
3.71  
3.98  
[1]  
Maximum DC  
Maximum (peak) DC  
Peak operating current (random write)  
Typical DC  
3σ  
DC  
3σ  
0.47  
0.49  
0.95  
0.33  
0.34  
0.74  
6.31  
6.53  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential read)  
Typical DC  
3σ  
DC  
3σ  
0.47  
0.49  
0.72  
0.17  
0.18  
0.42  
4.39  
4.61  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential write)  
Typical DC  
3σ  
DC  
3σ  
0.47  
0.49  
1.04  
0.33  
0.34  
0.69  
6.31  
6.53  
Maximum DC  
Maximum (peak) DC  
3σ  
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Table 9 100GB high endurance 2.5” model DC power requirements  
(Models ST100FM0093, ST100FM0103, ST100FM0113, ST100FM0123)  
PARAMETER  
100GB HIGH ENDURANCE (6.0Gb)  
[4]  
[2]  
Regulation  
Voltage  
±5%  
+5V  
±5%  
[2]  
+12V  
CURRENT (A) CURRENT (A) POWER (W)  
[1]  
DC  
Average idle current  
0.41  
0.07  
2.89  
Maximum starting current  
(peak DC) DC  
3σ  
3σ  
3σ  
0.65  
0.74  
0.46  
0.34  
0.55  
0.02  
(peak AC) AC  
[1] [3]  
Delayed start (max) DC  
2.54  
Peak operating current (random read):  
[1]  
Typical DC  
DC  
3σ  
0.45  
0.51  
0.97  
0.14  
0.17  
0.32  
3.93  
4.59  
[1]  
Maximum DC  
Maximum (peak) DC  
Peak operating current (random write)  
Typical DC  
3σ  
DC  
3σ  
0.47  
0.54  
0.77  
0.26  
0.31  
0.58  
5.47  
6.42  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential read)  
Typical DC  
3σ  
DC  
3σ  
0.48  
0.56  
0.73  
0.18  
0.18  
0.45  
4.56  
4.96  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential write)  
Typical DC  
3σ  
DC  
3σ  
0.47  
0.54  
0.75  
0.26  
0.27  
0.64  
5.47  
5.94  
Maximum DC  
Maximum (peak) DC  
3σ  
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Table 10 400GB standard 1.8” model DC power requirements  
(Models ST400FM0023, ST400FM0043, ST400FM0063, ST400FM0083)  
PARAMETER  
400GB (6.0Gb)  
[4]  
Regulation  
Voltage  
±5%  
±5%  
+5V  
+3.3V  
CURRENT (A) CURRENT (A) POWER (W)  
DC  
Average idle current  
Maximum starting current  
(peak DC) DC  
TBD  
TBD  
TBD  
3σ  
3σ  
3σ  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
(peak AC) AC  
[3]  
Delayed start (max) DC  
Peak operating current (random read):  
Typical DC  
TBD  
DC  
3σ  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Maximum DC  
Maximum (peak) DC  
Peak operating current (random write)  
Typical DC  
3σ  
DC  
3σ  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential read)  
Typical DC  
3σ  
DC  
3σ  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential write)  
Typical DC  
3σ  
DC  
3σ  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Maximum DC  
Maximum (peak) DC  
3σ  
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Table 11 200GB standard 1.8” model DC power requirements  
(Models ST200FM0023, ST200FM0043, ST200FM0063, ST200FM0083)  
PARAMETER  
200GB (6.0Gb)  
[4]  
Regulation  
Voltage  
±5%  
±5%  
+5V  
+3.3V  
CURRENT (A) CURRENT (A) POWER (W)  
DC  
Average idle current  
Maximum starting current  
(peak DC) DC  
TBD  
TBD  
TBD  
3σ  
3σ  
3σ  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
(peak AC) AC  
[3]  
Delayed start (max) DC  
Peak operating current (random read):  
Typical DC  
TBD  
DC  
3σ  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Maximum DC  
Maximum (peak) DC  
Peak operating current (random write)  
Typical DC  
3σ  
DC  
3σ  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential read)  
Typical DC  
3σ  
DC  
3σ  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Maximum DC  
Maximum (peak) DC  
Peak operating current (sequential write)  
Typical DC  
3σ  
DC  
3σ  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Maximum DC  
Maximum (peak) DC  
3σ  
[1] Measured with average reading DC ammeter. Instantaneous +12V current peaks will exceed these values. Power sup-  
ply at nominal voltage. N (number of drives tested) = 6, 60 Degrees C ambient.  
[2] For +12 V, a –10% tolerance is allowed during initial start but must return to ±5% before reaching ready state. The ±5%  
must be maintained after the drive signifies that its power-up sequence has been completed and that the drive is able to  
accept selection by the host initiator.  
[3] This condition occurs after OOB and Speed Negotiation completes but before the drive has received the Notify Spinup  
primitive.  
[4] See paragraph 6.3.1, "Conducted noise immunity." Specified voltage tolerance includes ripple, noise, and transient  
response.  
General DC power requirement notes.  
1. Minimum current loading for each supply voltage is not less than 1.7% of the maximum operating current shown.  
2. The +3.3V, +5V and +12V supplies should employ separate ground returns.  
3. Where power is provided to multiple drives from a common supply, careful consideration for individual drive power  
requirements should be noted. Where multiple units are powered on simultaneously, the peak starting current must be  
available to each device.  
4. Parameters, other than start, are measured after a 10-minute warm up.  
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6.3.1 Conducted noise immunity  
Noise is specified as a periodic and random distribution of frequencies covering a defined frequency. Maximum allowed  
noise values given below are peak-to-peak measurements and apply at the drive power connector.  
+3.3v  
+5v  
=
=
=
TBD mv pp from TBD Hz to TBD Mhz  
250 mV pp from 100 Hz to 20 MHz.  
+12v  
450 mV pp from 100 Hz to 100 KHz.  
250 mV pp from 100 KHz to 20 MHz.  
150 mV pp from 20 MHz to 80 MHz.  
6.3.2 Power sequencing  
The drive does not require power sequencing. The drive protects against inadvertent writing during power-up and down.  
6.3.3 Current profiles  
The +12V and +5V current profiles for the Seagate 1200 SSD 2.5” drives are shown below.  
Figure 1. Current profiles for 800GB standard and 400GB High Endurance models  
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Figure 2. Current profiles for 400GB standard and 200GB high endurance models  
Figure 3. Current profiles for 200GB standard and 100GB high endurance models  
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Figure 4. Current profiles for 400GB 1.8” models  
Figure 5. Current profiles for 200GB 1.8” models  
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6.4  
POWER DISSIPATION  
800GB standard 2.5” models in 6Gb operation  
(Models ST800FM0013, ST800FM0023, ST800FM0033, ST800FM0043, ST800FM0053, ST800FM0063)  
Typical power dissipation under idle conditions in 6Gb operation is 3.30 watts (11.26 BTUs per hour).  
typical I/O rate for a drive in the system on the horizontal axis and read the corresponding +5 volt current, +12 volt current,  
and total watts on the vertical axis. To calculate BTUs per hour, multiply watts by 3.4123.  
Figure 6. 800GB (at 6Gb) DC current and power vs. input/output operations per second  
400GB standard 2.5” models in 6Gb operation  
(Models ST400FM0013, ST400FM0033, ST400FM0053, ST400FM0073)  
Typical power dissipation under idle conditions in 6Gb operation is 2.72 watts (9.28 BTUs per hour).  
typical I/O rate for a drive in the system on the horizontal axis and read the corresponding +5 volt current, +12 volt current,  
and total watts on the vertical axis. To calculate BTUs per hour, multiply watts by 3.4123.  
Figure 7. 400GB (at 6Gb) DC current and power vs. input/output operations per second  
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200GB standard 2.5” models in 6Gb operation  
(Models ST200FM0013, ST200FM0033, ST200FM0053, ST200FM0073)  
Typical power dissipation under idle conditions in 6Gb operation is 2.89 watts (9.86 BTUs per hour).  
typical I/O rate for a drive in the system on the horizontal axis and read the corresponding +5 volt current, +12 volt current,  
and total watts on the vertical axis. To calculate BTUs per hour, multiply watts by 3.4123.  
Figure 8. 200GB (at 6Gb) DC current and power vs. input/output operations per second  
400GB high endurance 2.5” models in 6Gb operation  
(Models ST400FM0093, ST400FM0103, ST400FM0113, ST400FM0123)  
Typical power dissipation under idle conditions in 6Gb operation is 3.30 watts (11.26 BTUs per hour).  
typical I/O rate for a drive in the system on the horizontal axis and read the corresponding +5 volt current, +12 volt current,  
and total watts on the vertical axis. To calculate BTUs per hour, multiply watts by 3.4123.  
Figure 9. 400GB (at 6Gb) DC current and power vs. input/output operations per second  
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